@Article{DelgadilloCrVaCaAlMi:1997:PhTeMo,
author = "Delgadillo, I. and Cruz-Orea, A. and Vargas, H. and Calder{\'o}n,
A. and Alvarado-Gil, J. J. and Miranda, Luiz Carlos Moura",
affiliation = "Inst. Politecn Nalc, CTR Invest and Estudios Avanzados, PMCATA,
Mexico and Instituto Nacional de Pesquisas Espaciais,
Laborat{\'o}rio Associado de Sensores e Materiais",
title = "Photoacoustic technique for monitoring the thermal properties of
porous silicon",
journal = "Progress in Electromagnetics Research",
year = "1997",
volume = "36",
number = "2",
pages = "343--347",
month = "Feb.",
keywords = "Photoacoustic technique, Thermal properties, Porous silicon.",
abstract = "The use of the photoacoustic technique to monitor the thermal
properties of materials that can be obtained only as parts of
multicomponent samples is illustrated by performing the thermal
characterization of two porous materials: porous silicon obtained
from n-type crystalline silicon through the spark process and that
obtained through the electrochemical etching method. This
nonseparative, and hence nondestructive, approach makes use of an
effective thermal diffusivity treatment based on the analogy
between thermal and electrical resistances, in combination with
simplified compositional models for the corresponding
multicomponent systems. The thermal parameters obtained are in
agreement with existent studies concerning the composition of
these materials. This approach offers the possibility of
performing the thermal characterization of other porous
semiconductors and analogous materials.",
copyholder = "SID/SCD",
issn = "1070-4698 and 1559-8985",
targetfile = "1997_delgadillo.pdf",
urlaccessdate = "12 maio 2024"
}